DRX-II-PS Transient Plane Source Thermal Conductivity Analyzer
Published: 3/31/2025
Transient Plane Source instrument for rapid measurement of thermal conductivity across solids, powders, films, coatings, liquids, and anisotropic materials. Suitable for R&D and quality control in power, automotive, materials science, and biopharma applications.
Product Description
The DRX-II-PS is a thermal conductivity analyzer based on the Transient Plane Source (TPS) method, enabling direct measurement of transient heat propagation within seconds. Unlike steady-state techniques, the TPS approach mitigates contact thermal resistance effects and requires only a relatively flat sample surface, minimizing sample preparation.
The system supports multiple test modules and probes to address a wide range of materials including metals, alloys, ceramics, ores, composites, silicon wafers, polymers, binders, paper, textiles, printed circuit boards, and propellants. Measurement control, data acquisition, and analysis are performed via dedicated PC software, providing reliable results for research and industrial quality assurance.
Technical Specifications
| Parameter | Specification |
|---|---|
| Details | Thermal conductivity range: 0.005–500 W/m·K Temperature range: Ambient to 200 ℃ Measurement method: Transient Plane Source (TPS) Accuracy: ±3% Material compatibility: Metals, alloys, ceramics, ores, composites, silicon wafers, polymers, binders, paper, textiles, printed circuit boards, propellants Sample forms: Solids, powders, thin films, coatings, liquids, anisotropic materials Test modules: Basic, Thin Film, Flat Plate, Anisotropic, Single-Sided Probe sizes: Φ2–Φ30 mm; optional Φ50–Φ100 mm Measurement time: Seconds to minutes Data acquisition and analysis: PC software Standard configuration: Main unit (1), test software (1); computer required (user-supplied) |
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B6-101, Zhongnan High-Tech Intelligent Manufacturing Industrial Park, No. 10 Shuangma Street, Yuetang District, Xiangtan City, Hunan Province, China
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