Ceramic Dielectric Loss Tangent and Dielectric Constant Tester
The instrument measures dielectric loss tangent (tanδ) and dielectric constant (ε) in electrical ceramics, device ceramics, and capacitor ceramics. It references GB/T 5594.4-1985 and provides frequency, Q-value, inductance, and specimen-dimension measurements for inorganic non-metallic materials research.
- Model
- STD
- Category
- Electrical Testing
Product Description
The tester measures dielectric loss tangent and dielectric constant to study factors affecting these properties in electrical ceramics, device ceramics, capacitor ceramics, and related materials. It is intended for universities and research institutes studying inorganic non-metallic materials.
Frequency is divided into seven bands. The Q-value and inductance ranges and their frequency-dependent errors are listed in the specifications. Disc specimens use thickness and diameter conditions tied to dielectric-constant value.
Technical Specifications
| Parameter | Specification |
|---|---|
| Referenced standard | GB/T 5594.4-1985 |
| Frequency range | 50 kHz–50 MHz |
| Frequency bands | Seven bands: 50–150 kHz; 150–450 kHz; 450–1500 kHz; 1.5–4.5 MHz; 4.5–12 MHz; 12–25 MHz; 25–50 MHz |
| Q-value range | 5–500 |
| ΔQ range | −25–0–25 |
| Inductance range | 0.1 μH–100 mH |
| Inductance resolution | 0.01 μH |
| Disc specimen thickness | 2 ± 0.5 mm |
| Disc diameter when ε < 12 | Ø30–40 mm |
| Disc diameter when ε = 12–30 | Ø25–35 mm |
| Disc diameter when ε > 30 | Ø15–20 mm |
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