High-Temperature Laser Thermal Conductivity Analyzer
Published: 6/18/2025
Laser flash analysis measures thermal diffusivity and calculates thermal conductivity and specific heat across a wide temperature range. The DRX-II-JG supports multi-sample testing and configurable atmospheres for metals, ceramics, polymers, carbon materials, powders, liquids, films, and slags.
Product Description
The DRX-II-JG is a modular laser flash thermal property analyzer designed to determine thermal diffusivity, thermal conductivity, and specific heat over configurable temperature ranges up to 1600°C with options extending down to −125°C or up to 2800°C by furnace replacement. It supports 1, 3, or 6 samples with an optional automatic feeder and multiple sample holders suited for solids, low- and high-viscosity liquids, melts, powders, films, and slags.
In operation, a short energy pulse (Nd:YAG) irradiates the sample bottom at a set temperature, producing a transient temperature rise on the top surface that is captured by a high-speed IR detector. Thermal diffusivity is computed from the temperature–time response; with known or comparative specific heat, thermal conductivity is derived. The system offers vacuum and controlled atmospheres (inert, oxidizing, reducing; static or dynamic), multi-layer contact resistance analysis, pulse-width/energy corrections, heat-loss corrections, and integrated data acquisition and analysis software.
Technical Specifications
| Parameter | Specification |
|---|---|
| Details | Measurement principle: Laser flash (pulse heating, IR detection) Standards: GJB 1201.1-91; GB/T 22588-2008; ASTM D1461 Temperature range options: RT–500°C; RT–1000°C; RT–1600°C (furnace configurable) Extended temperature capability: −125°C to 2800°C (by furnace replacement; selectable) Heating/cooling rate: 0.1–30°C/min (settable) Sample size (typical): Square ≥ 10 × 10 mm; Round ≤ φ20 mm; Thickness 1–10 mm (special sizes on request) Sample capacity: 1, 3, or 6 positions (automatic feeder optional) Measurement environments: Vacuum and protective atmospheres Vacuum level: −0.1 MPa (standard); 1.0×10^−3 Pa (custom option) Atmospheres: Inert, oxidizing, reducing (static/dynamic) Thermal diffusivity range: 0.01–1000 mm²/s Thermal conductivity range: 0.1–2000 W/m·K Pulse source: Nd:YAG laser Pulse energy: 15 J/pulse Pulse energy adjustability: Yes Pulse interval: Software configurable IR detector: InSb/MCT, air-cooled Sample types: Solid bulk, low-viscosity liquid, high-viscosity liquid, solid powder, viscous semi-solid, elastic solid, films Sample holders: Graphite; SiC; Al2O3; metal (others customizable); automatic feeder supplied Analysis features: Multi-layer/contact thermal resistance analysis; specific heat via comparative method using standards; pulse-width correction; pulse energy integration; heat-loss correction; built-in database Data acquisition rate: Up to 2 MHz Host interface: USB and dedicated portable interface; optional Ethernet for data networking and remote testing Software: Dedicated analysis and control software; supports Windows 10 64-bit Repeatability (Cp): ±3% (most materials) Repeatability (thermal diffusivity): ±2 (unit per source; typical repeatability within ±2% for most materials) System architecture: Integrated electronics; separated hardware and electronics with optional shielding for nuclear-related applications Typical configuration: Test host with high-temperature furnace, sample feeder, analysis software, branded PC |
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B6-101, Zhongnan High-Tech Intelligent Manufacturing Industrial Park, No. 10 Shuangma Street, Yuetang District, Xiangtan City, Hunan Province, China
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