Laser Flash Thermal Conductivity Analyzer
Published: 4/11/2025
Laser pulse energy heats a sample and an infrared detector records the rear-face temperature rise to compute thermal diffusivity, specific heat, and thermal conductivity. The system supports multi-sample, modular furnaces, and atmospheres for metals, ceramics, polymers, composites, powders, liquids, melts, and slags per GJB 1201.1-91 and ASTM D1461.
Product Description
The DRX-II-JG Laser Flash Thermal Conductivity Analyzer measures thermal diffusivity from the transient rear-face temperature response after a short laser pulse. By combining diffusivity with density and specific heat, the instrument determines thermal conductivity; specific heat can be derived by comparison with standards.
A modular design allows furnace replacement to cover selectable temperature ranges and supports various sample holders for solids, liquids, melts, slags, powders, and thin films. The system can be configured with automatic sample feeding for 1, 3, or 6 specimens, vacuum or controlled atmospheres (inert, oxidizing, or reducing), and robust data acquisition and analysis software with multiple fitting models, pulse-width correction, energy integration, and heat-loss corrections.
Technical Specifications
| Parameter | Specification |
|---|---|
| Details | Measurement principle: Laser flash (rear-face IR detection) Pulse source: Nd:YAG laser Pulse energy: 15 J per shot Pulse energy adjustability: Yes Pulse interval control: Software-set Detector: InSb/MCT, air-cooled Temperature range options: Ambient (RT), RT–500 ℃, RT–1000 ℃, RT–1600 ℃ (other furnace options selectable; overall configurable −125 to 2800 ℃) Heating/cooling rate: 0.1–30 ℃/min (user-set) Sample capacity: 1, 3, or 6 positions (automatic sampler optional) Sample size (typical): Square ≥ 10 × 10 mm; Round ≤ φ20 mm; Thickness 1–10 mm (custom on request) Thermal diffusivity range: 0.01–1000 mm²/s Thermal conductivity range: 0.1–2000 W/(m·K) Specific heat determination: Comparison method with standards (Cp repeatability: ±3% for most materials) Thermal diffusivity repeatability: ±2% for most materials Data acquisition rate: Up to 2 MHz Atmosphere modes: Vacuum and protective gas Vacuum level: −0.1 MPa (standard), 1×10⁻³ Pa (special customization) Atmospheres supported: Inert, oxidizing, reducing; static or dynamic Sample types supported: Bulk solids, low/high-viscosity liquids, powders (with clamps), viscous semi-solids, elastic solids, thin films, melts, slags Sample holders: Graphite, SiC, Al₂O₃, metal (customizable) Computer interface: USB and dedicated portable interface; optional Ethernet for data networking and remote testing Software features: Multi-model fitting, pulse-width correction, pulse energy integration, heat-loss correction, built-in database, automated reporting Operating system support: Windows 10 64-bit Standards compliance: GJB 1201.1-91; ASTM D1461 Typical system configuration: Test mainframe with high-temperature furnace, autosampler (optional), analysis software, PC |
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B6-101, Zhongnan High-Tech Intelligent Manufacturing Industrial Park, No. 10 Shuangma Street, Yuetang District, Xiangtan City, Hunan Province, China
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